INTEGRATED TECHNOLOGY CORPORATION
Probe card metrology, analysis and repair tools. Dynamic test systems for power semiconductors, IGBT, MOSFET's, BiPolar high current and high voltage.
JetEtch decapsulating etch equipment, OmniEtch bare die delayering and deprocessing, formerly B&G.
ThermoStreams, Hot Chucks to 300°, Cold Chucks to -65°, CV Chucks, Precise Temperature Control.
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